DocumentCode :
1416026
Title :
Quasi-TEM spectral domain approach for calculating distributed inductance and resistance of microstrip on Si-SiO2 substrate
Author :
Tripathi, A. ; Hahm, Yeon-Chang ; Weisshaar, A. ; Tripathi, V.K.
Author_Institution :
Dept. of Electr. & Comput. Eng., Oregon State Univ., Corvallis, OR, USA
Volume :
34
Issue :
13
fYear :
1998
fDate :
6/25/1998 12:00:00 AM
Firstpage :
1330
Lastpage :
1331
Abstract :
A quasi-TEM spectral domain approach based on the vector magnetic potential equation to calculate frequency dependent distributed inductance and the associated distributed series resistance of a microstrip on Si-SiO2 substrate is presented. It is shown that the calculated frequency dependent inductance and the associated resistance are in good agreement with the results obtained from rigorous full wave solutions
Keywords :
CMOS integrated circuits; UHF integrated circuits; electric resistance; inductance; microstrip lines; silicon; silicon compounds; spectral-domain analysis; substrates; CMOS RFICs; Si-SiO2; Si-SiO2 substrate; SiO2; distributed inductance; distributed series resistance; frequency dependent inductance; microstrip; quasi-TEM spectral domain approach; vector magnetic potential equation;
fLanguage :
English
Journal_Title :
Electronics Letters
Publisher :
iet
ISSN :
0013-5194
Type :
jour
DOI :
10.1049/el:19980837
Filename :
707248
Link To Document :
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