DocumentCode
1416035
Title
Method for measuring noise parameters of microwave two-port
Author
Lazaro, A. ; Pradell, L. ; Callaghan, J. M O
Author_Institution
Polytech. Univ. of Catelunya, Barcelona, Spain
Volume
34
Issue
13
fYear
1998
fDate
6/25/1998 12:00:00 AM
Firstpage
1332
Lastpage
1333
Abstract
A new tuner-based method for measuring the four noise-parameters of a two-port is proposed. It makes use of a novel measurement ratio that includes noise powers and mismatch factors simultaneously. In contrast to previous works, no restrictions on the noise source, tuner state temperatures and cold temperatures are assumed
Keywords
circuit noise; electric noise measurement; high electron mobility transistors; microwave circuits; microwave devices; microwave measurement; semiconductor device noise; semiconductor device testing; tuning; two-port networks; HEMT; measurement ratio; microwave two-port; mismatch factors; noise parameters measurement method; noise powers; receiver calibration; tuner-based method;
fLanguage
English
Journal_Title
Electronics Letters
Publisher
iet
ISSN
0013-5194
Type
jour
DOI
10.1049/el:19980942
Filename
707249
Link To Document