Title :
Method for measuring noise parameters of microwave two-port
Author :
Lazaro, A. ; Pradell, L. ; Callaghan, J. M O
Author_Institution :
Polytech. Univ. of Catelunya, Barcelona, Spain
fDate :
6/25/1998 12:00:00 AM
Abstract :
A new tuner-based method for measuring the four noise-parameters of a two-port is proposed. It makes use of a novel measurement ratio that includes noise powers and mismatch factors simultaneously. In contrast to previous works, no restrictions on the noise source, tuner state temperatures and cold temperatures are assumed
Keywords :
circuit noise; electric noise measurement; high electron mobility transistors; microwave circuits; microwave devices; microwave measurement; semiconductor device noise; semiconductor device testing; tuning; two-port networks; HEMT; measurement ratio; microwave two-port; mismatch factors; noise parameters measurement method; noise powers; receiver calibration; tuner-based method;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19980942
