DocumentCode
1416081
Title
Adaptive Testing: Dealing with Process Variability
Author
Maxwell, Peter
Author_Institution
Aptina, San Jose, CA, USA
Volume
28
Issue
6
fYear
2011
Firstpage
41
Lastpage
49
Abstract
This article describes the development of adaptive testing in response to the ever-growing need to dynamically and cost-effectively tailor IC testing to discriminately manage manufacturing process variations. Various degrees of adoption are presented, together with benefits and examples of its use. Finally, challenges for future development are discussed.
Keywords
integrated circuit design; integrated circuit manufacture; integrated circuit testing; IC testing; adaptive testing; integrated circuits; manufacturing process variation; Adaptation models; Integrated circuit reliability; Integrated circuit testing; Manufacturing processes; Mathematical model; Real time systems; design and test; real-time analysis; statistical data analysis; test flow; variability;
fLanguage
English
Journal_Title
Design & Test of Computers, IEEE
Publisher
ieee
ISSN
0740-7475
Type
jour
DOI
10.1109/MDT.2011.118
Filename
6123680
Link To Document