Title :
RF Front-End Test Using Built-in Sensors
Author :
Abdallah, Louay ; Stratigopoulos, Haralampos-G ; Mir, Salvador ; Kelma, Christophe
Abstract :
This article proposes a new class of sensors for built-in test in RF devices. These sensors are placed in close proximity to the DUT on the same substrate without being electrically connected to it. Instead, they monitor it by virtue of being subjected to the same process variations. The authors also describe other types of sensors they have studied, including DC probes, an envelope detector, and a current sensor.
Keywords :
built-in self test; integrated circuit testing; radiofrequency integrated circuits; DC probes; RF devices; RF front-end test; built-in sensors; built-in test; current sensor; envelope detector; Envelope detectors; Layout; Radio frequency; Sensor phenomena and characterization; Sensors; Transistors; DUT; RF test; alternate test; built-in test; design and test; on-chip sensors;
Journal_Title :
Design & Test of Computers, IEEE
DOI :
10.1109/MDT.2011.131
