Title :
Measurements of the temperature dependence of the output voltages of some Zener diode based voltage standards
Author_Institution :
Bur. Int. des Poids et Mesures, Pavillon de Breteuil, Sevres, France
fDate :
7/1/1998 12:00:00 AM
Abstract :
The author describes a test facility and procedures for determining the temperature coefficients of the 1.018 V and 10 V outputs of Fluke 732B electronic voltage standards based on temperature-regulated Zener diodes. Of the fifteen instruments studied fourteen were found to have statistically significant temperature coefficients for the 1.018 V outputs with respect to ambient temperature: values range from -39×10-9/°C to 41×10-9/°C. For the 10 V outputs, ten of the fifteen have statistically significant temperature coefficients ranging from -15×10-9/°C to 16×10-9/°C. By applying small corrections for temperature dependence, based on coefficients describing the change in output voltage as a function of the resistance of the internal thermistor, errors in calibrating and comparing these standards can be reduced
Keywords :
Zener diodes; calibration; measurement errors; measurement standards; voltage measurement; 1.018 V; 10 V; Fluke 732B electronic voltage standards; Zener diode based voltage standards; compensation; internal thermistor; output voltages; reduced calibration errors; small corrections; temperature coefficients; temperature dependence; temperature-regulated Zener diodes; test facility;
Journal_Title :
Science, Measurement and Technology, IEE Proceedings -
DOI :
10.1049/ip-smt:19982097