DocumentCode
1416530
Title
Reliability of liquid crystal polymer air cavity packaging
Author
Aihara, Kunia ; Chen, Morgan Jikang ; Chen, Cheng ; Pham, Anh-Vu H.
Author_Institution
Air Force Res. Lab., Wright-Patterson AFB, OH, USA
Volume
2
Issue
2
fYear
2012
Firstpage
224
Lastpage
230
Abstract
We present the development of liquid crystal polymer (LCP) packages and thermal compression sealing processes. We demonstrate the complete process for prototyping, sealing, and assembling a single-chip LCP package at microwave frequencies. Using the thermal compression technique, we achieve a measured fine leak rate of 3.7×10-8 cc-atm/s of a LCP package cavity. We have conducted a series of environmental tests such as temperature cycling and 85°C and 85% humidity. We demonstrated that LCP packages have passed major environmental tests and proved to be a reliable package platform.
Keywords
assembling; chip scale packaging; liquid crystal polymers; reliability; assembling; liquid crystal polymer air cavity packaging; microwave frequencies; reliability; single-chip LCP package; thermal compression sealing; Cavity resonators; Helium; Humidity; Moisture; Reliability; Temperature measurement; Testing; Cavities; liquid crystal polymer; organic; packaging;
fLanguage
English
Journal_Title
Components, Packaging and Manufacturing Technology, IEEE Transactions on
Publisher
ieee
ISSN
2156-3950
Type
jour
DOI
10.1109/TCPMT.2011.2178092
Filename
6125236
Link To Document