DocumentCode :
1416597
Title :
Compact Modeling of Perpendicular-Anisotropy CoFeB/MgO Magnetic Tunnel Junctions
Author :
Zhang, Yue ; Zhao, Weisheng ; Lakys, Yahya ; Klein, Jacques-Olivier ; Kim, Joo-Von ; Ravelosona, Dafiné ; Chappert, Claude
Author_Institution :
Inst. d´´Electron. Fondamentale, Univ. of Paris-Sud 11, Orsay, France
Volume :
59
Issue :
3
fYear :
2012
fDate :
3/1/2012 12:00:00 AM
Firstpage :
819
Lastpage :
826
Abstract :
Magnetic tunnel junctions (MTJs) composed of ferromagnetic layers with perpendicular magnetic anisotropy (PMA) are of great interest for achieving high-density nonvolatile memory and logic chips owing to its scalability potential together with high thermal stability. Recent progress has demonstrated a capacity for high-speed performance and low power consumption through current-induced magnetization switching. In this paper, we present a compact model of the CoFeB/MgO PMA MTJ, a system exhibiting the best tunnel magnetoresistance ratio and switching performance. It integrates the physical models of static, dynamic, and stochastic behaviors; many experimental parameters are directly included to improve the agreement of simulation with experimental measurements. Mixed simulation based on the 65-nm technology node of a magnetic flip-flop validates its relevance and efficiency for MTJ/CMOS memory and logic chip design.
Keywords :
CMOS memory circuits; cobalt compounds; flip-flops; iron compounds; logic circuits; magnesium compounds; magnetic logic; magnetoresistive devices; random-access storage; tunnelling magnetoresistance; CoFeB-MgO; MTJ-CMOS memory; current-induced magnetization switching; ferromagnetic layers; high thermal stability; high-density nonvolatile memory; logic chip design; low power consumption; magnetic flip-flop; perpendicular-anisotropy magnetic tunnel junctions; size 65 nm; stochastic behaviors; switching performance; tunnel magnetoresistance ratio; CMOS integrated circuits; Integrated circuit modeling; Magnetic tunneling; Mathematical model; Semiconductor device modeling; Switches; Tunneling magnetoresistance; Compact modeling; magnetic tunnel junction (MTJ); perpendicular magnetic anisotropy (PMA); spin transfer torque (STT);
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/TED.2011.2178416
Filename :
6125245
Link To Document :
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