Title :
Basic study of fitting method for base curve extraction in lightning impulse test techniques
Author :
Okabe, Shigemitsu ; Tsuboi, Toshihiro ; Ueta, Genyou ; Takami, Jun ; Hirose, Hideo
Author_Institution :
R&D Center, Tokyo Electr. Power Co., Yokohama, Japan
fDate :
2/1/2010 12:00:00 AM
Abstract :
The IEC, which prescribes lightning impulse test techniques for electric power equipment, is about to introduce the k-factor method for evaluating the overshoot of impulse waveforms. Its procedure specifies that waveforms are to be fitted with a double exponential function to derive a base curve. Some derived waveforms, however, deviate upwards from the central lines of the recorded waveforms in the wavefront area. This paper examines a more rational method of extracting a base curve by considering the relationships between equivalent electric circuits and the solutions of their governing equations. A trial calculation with the new methods gives results with lower crest values and slower rises than the existing method.
Keywords :
IEC standards; curve fitting; equivalent circuits; impulse testing; lightning; power apparatus; IEC; base curve extraction; double exponential function; electric power equipment; equivalent electric circuits; fitting method; impulse waveform overshoot evaluation; k-factor method; lightning impulse test techniques; Circuit testing; Curve fitting; Data mining; Dielectrics and electrical insulation; IEC standards; Impulse testing; Insulation testing; Lightning; Low pass filters; Voltage; IEC 60060-1; Lightning impulse test; base curve; double exponential;
Journal_Title :
Dielectrics and Electrical Insulation, IEEE Transactions on
DOI :
10.1109/TDEI.2010.5411995