DocumentCode
141674
Title
An ontology-based approach for decentralized monitoring and diagnostics
Author
Abele, Lisa ; Grimm, Stephan ; Zillner, Sonja ; Kleinsteuber, Martin
Author_Institution
Siemens AG - Corp. Technol., Munich, Germany
fYear
2014
fDate
27-30 July 2014
Firstpage
706
Lastpage
712
Abstract
Modern decentralized industrial applications demand the design of application-independent solutions for monitoring and diagnostics systems (MDSs) that exhibit a high degree of flexibility and re-utilization. To achieve this, we propose an ontology-based approach that adheres to the Meta Object Facility (MOF) paradigm for engineering and maintenance of MDSs. The key of our approach is to built a decentralized system architecture implemented on a semantic technology stack. Our architecture allows for storing plant engineering expert knowledge and the monitoring and diagnosis rules in formalized OWL models. The plant models can then be processed by the rules to compute monitoring states and diagnose causes of faults. This paper specifically focuses on a system implementation in alignment to requirements of the industrial domain. Based on these requirements, alternative knowledge-based tools and techniques are compared to evaluate the effectiveness of our approach.
Keywords
condition monitoring; inspection; maintenance engineering; ontologies (artificial intelligence); production engineering computing; MDS engineering; MDS maintenance; MOF paradigm; decentralized monitoring and diagnostics system; flexibility degree; industrial domain; meta object facility paradigm; ontology-based approach; semantic technology stack; Adaptation models; Knowledge based systems; Knowledge engineering; Monitoring; Navigation; Object oriented modeling; Unified modeling language;
fLanguage
English
Publisher
ieee
Conference_Titel
Industrial Informatics (INDIN), 2014 12th IEEE International Conference on
Conference_Location
Porto Alegre
Type
conf
DOI
10.1109/INDIN.2014.6945600
Filename
6945600
Link To Document