• DocumentCode
    1416761
  • Title

    Color Range Images Captured by a Four-Phase CMOS Image Sensor

  • Author

    Lin, Dong-Long ; Wang, Ching-Chun ; Wei, Chia-Ling

  • Author_Institution
    Dept. of Electr. Eng., Nat. Cheng Kung Univ., Tainan, Taiwan
  • Volume
    58
  • Issue
    3
  • fYear
    2011
  • fDate
    3/1/2011 12:00:00 AM
  • Firstpage
    732
  • Lastpage
    739
  • Abstract
    As 3-D displays become more common, the demand for 3-D-related products is rapidly increased. Three-dimensional image sensors based on the time-of-flight (TOF) technique are one of these products and are applied to many applications. In this paper, a new pixel based on the continuous-wave modulation method was proposed to measure the TOF and was embedded in a test complementary metal-oxide-semiconductor (CMOS) image sensor. Compared with other range imagers, no complex control signals, high operating voltage, or multilevel control voltages are needed in this pixel. The chip, with 92 × 30 pixels, was fabricated using the Taiwan Semiconductor Manufacturing Company´s 0.18-μm CMOS standard process, and a time-switched color measurement was applied to this rangeflnder system. A pulse train of red, green, and blue lights is emitted sequentially from a light-emitting diode array. The distance is easily calculated from the phase differences, and the color information is estimated using the difference in reflection coefficients under a different light. The measured distance and color are compared with the actual dis tance and color-corrected images. A color range image with a distance error of 3.56 cm and an L*a*b color difference of 40.23 can be observed. This rangefinder system provides a new perspective to capturing a colored range image.
  • Keywords
    CMOS image sensors; LED displays; distance measurement; image colour analysis; three-dimensional displays; 3D display; CMOS standard process; TOF measurement; Taiwan semiconductor manufacturing company; color corrected image; color range image; complex control signal; continuous wave modulation method; distance measurement; four phase CMOS image sensor; light emitting diode array; metal oxide semiconductor image sensor; multilevel control voltage; rangefinder system; reflection coefficient; three dimensional image sensor; time switched color measurement; time-of-flight technique; Color range image; complementary metal–oxide–semiconductor (CMOS) image sensor; three-dimensional (3-D); time of flight (TOF);
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/TED.2010.2095857
  • Filename
    5678637