• DocumentCode
    1416765
  • Title

    Imaging of a compact range using autoregressive spectral estimation (radiation patterns measurement)

  • Author

    Walton, Eric K. ; Moghaddar, Ali

  • Author_Institution
    ElectroSci. Lab., Ohio State Univ., Columbus, OH, USA
  • Volume
    6
  • Issue
    7
  • fYear
    1991
  • fDate
    7/1/1991 12:00:00 AM
  • Firstpage
    15
  • Lastpage
    20
  • Abstract
    The spurious scattering mechanisms of a compact range, which cause spurious signals as well as the desired plane wave to illuminate the test zone, are addressed. It is shown that an accurate estimation of the direction-of-arrival and amplitude of spurious signals in a compact range is beyond the resolution available from the Fourier transform. An estimation technique based on autoregressive (AR) modeling of field probe data is developed to locate and quantify the spurious signal sources. The probe aperture is divided into a number of overlapping subapertures so that the far-field criterion for each subaperture is satisfied. Then, the subaperture data are modeled as an AR process. Singular value decomposition and forward-backward linear prediction are used to estimate the model order and the AR parameters. Examples of probe measurements and analysis for an actual compact range are given.<>
  • Keywords
    antenna radiation patterns; antenna theory; electromagnetic wave scattering; estimation theory; radar cross-sections; radar theory; signal detection; spectral analysis; amplitude; antenna characteristics; autoregressive spectral estimation; direction-of-arrival; far-field criterion; forward-backward linear prediction; overlapping subapertures; probe measurements; radar characteristics; singular value decomposition; spurious scattering; spurious signals; test zone; Anechoic chambers; Antenna measurements; Electromagnetic measurements; Electromagnetic radiation; Electromagnetic scattering; Probes; Radar antennas; Radar cross section; Radar scattering; Testing;
  • fLanguage
    English
  • Journal_Title
    Aerospace and Electronic Systems Magazine, IEEE
  • Publisher
    ieee
  • ISSN
    0885-8985
  • Type

    jour

  • DOI
    10.1109/62.89002
  • Filename
    89002