DocumentCode :
1417049
Title :
Comprehensive Modeling of Superluminescent Light-Emitting Diodes
Author :
Li, Z.Q. ; Li, Z. M Simon
Author_Institution :
Crosslight Software, Inc., Burnaby, BC, Canada
Volume :
46
Issue :
4
fYear :
2010
fDate :
4/1/2010 12:00:00 AM
Firstpage :
454
Lastpage :
461
Abstract :
We present a self-consistent electric and optic model for superluminescent light-emitting diodes (SLED) using 3D finite-element method. The carrier transport is calculated by the drift-diffusion method, which is coupled with the radiative recombination obtained from the solution of Shrodinger-Poison equations self-consistently. The spontaneous emission noise is described by the fundamental theory using the Green´s function method. Our model allows 2D treatment of the carrier dynamics and optical confinement on the transverse plane, along with the electronic and optical variation on the longitudinal axis. The theoretical model has been benchmarked with an InP-based edge-emitting SLED. The device has nonidentical quantum wells with broad bandwidth from 1300 to 1600 nm. The results show the importance of 3D effects and demonstrate the validity of the model.
Keywords :
Green´s function methods; III-V semiconductors; finite element analysis; indium compounds; semiconductor quantum wells; superluminescent diodes; 3D finite-element method; Green function; InP; SLED; Shrodinger-Poison equations; carrier dynamics; carrier transport; drift-diffusion method; nonidentical quantum wells; optic model for; optical confinement; radiative recombination; self-consistent electric model; spontaneous emission noise; superluminescent light-emitting diodes; Electromagnetic coupling; Finite element methods; Green´s function methods; Light emitting diodes; Optical noise; Radiative recombination; Schrodinger equation; Spontaneous emission; Stimulated emission; Superluminescent diodes; Modeling; quantum well; simulation; spontaneous emission; superluminescent light-emitting diodes (SLEDs);
fLanguage :
English
Journal_Title :
Quantum Electronics, IEEE Journal of
Publisher :
ieee
ISSN :
0018-9197
Type :
jour
DOI :
10.1109/JQE.2009.2032426
Filename :
5412127
Link To Document :
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