• DocumentCode
    1417221
  • Title

    The MOS-depletion-mode-thyristor: a new MOS controlled bipolar power device

  • Author

    Baliga, B. Jayant ; Chang, H.R.

  • Author_Institution
    Gen. Electr. Co., Schenectady, NY
  • Volume
    35
  • Issue
    12
  • fYear
    1988
  • fDate
    12/1/1988 12:00:00 AM
  • Firstpage
    2458
  • Abstract
    A novel MOS gate-controlled thyristor device is discussed. In these depletion-mode thyristors (DMTs), the depletion region formed by the application of a gate bias across an MOS gate is utilized to divert the current flowing in a thyristor element into a transistor element. This process turns off the device because the transistor element derives its base current from the thyristor element. The DMT offers the following attributes: (1) low forward voltage drop in the on-state at high current densities due to conduction via the thyristor element; (2) high-input-impedance MOS gate control, and (3) equivalent performance for complementary (n- and p-channel) devices. Experimental verification of the operation of the DMT devices has been achieved by the fabrication of 600-V devices using a trench (UMOS) gate technology. The forward conduction current density of the device was measured to be five times higher than that of the insulated-gate bipolar transistor at a forward drop of 1 V. Computer simulation of the forward conduction of the DMT indicates that its performance approaches that of a one-dimensional thyristor. The MOS gate controlled current turn-off under high-voltage DC switching has been demonstrated at current densities in excess of 5000 A/cm2
  • Keywords
    insulated gate field effect transistors; thyristors; 1 V; 600 V; 600-V devices; DMTs; MOS GTO; MOS controlled bipolar power device; MOS gate controlled current turn-off; MOS gate turnoff thyristor; MOS gate-controlled thyristor device; MOS-depletion-mode-thyristor; UMOS; attributes; complementary devices; depletion-mode thyristors; forward conduction; forward conduction current density; high current densities; high-input-impedance MOS gate control; high-voltage DC switching; low forward voltage drop; one-dimensional thyristor; operation; trench gate technology; Current density; Current measurement; Density measurement; Fabrication; Insulation; Low voltage; MOSFETs; OFDM modulation; Thyristors; Voltage control;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/16.8903
  • Filename
    8903