• DocumentCode
    1417226
  • Title

    A CMOS nested-chopper instrumentation amplifier with 100-nV offset

  • Author

    Bakker, Anton ; Thiele, Kevin ; Huijsing, Johan H.

  • Author_Institution
    Philips Semicond., Sunnyvale, CA, USA
  • Volume
    35
  • Issue
    12
  • fYear
    2000
  • Firstpage
    1877
  • Lastpage
    1883
  • Abstract
    A CMOS nested-chopper instrumentation amplifier is presented with a typical offset of 100 nV. This performance is obtained by nesting an additional low-frequency chopper pair around a conventional chopper amplifier. The inner chopper pair removes the 1/f noise, while the outer chopper pair reduces the residual offset. The test chip is free from 1/f noise and has a thermal noise of 27 nV//spl radic/Hz consuming a total supply current of 200 /spl mu/A.
  • Keywords
    1/f noise; CMOS analogue integrated circuits; choppers (circuits); instrumentation amplifiers; integrated circuit noise; interference suppression; 1/f noise removal; 100 nV; 200 muA; CMOS instrumentation amplifier; low-frequency chopper pair; nested-chopper instrumentation amplifier; offset cancellation; residual offset reduction; CMOS technology; Choppers; Frequency; Instruments; Low-frequency noise; Low-noise amplifiers; Noise cancellation; Noise reduction; Operational amplifiers; Semiconductor device noise;
  • fLanguage
    English
  • Journal_Title
    Solid-State Circuits, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9200
  • Type

    jour

  • DOI
    10.1109/4.890300
  • Filename
    890300