Title :
Dielectric characterization of low-loss materials a comparison of techniques
Author :
Baker-Jarvis, James ; Geyer, Richard G. ; Grosvenor, John H., Jr. ; Janezic, Michael D. ; Jones, Chriss A. ; Riddle, Bill ; Weil, Claude M. ; Krupka, Jerzy
Author_Institution :
Electromagn. Fields Div., Nat. Inst. of Stand. & Technol., Boulder, CO, USA
fDate :
8/1/1998 12:00:00 AM
Abstract :
Measurements on low-loss materials using closed and open cavity resonators, and dielectric resonator methods are presented. Results indicate that consistent measurement results can be obtained with a number of well-characterized fixtures. Uncertainties associated with each method are addressed. Measurements also were performed on materials used in previous intercomparisons
Keywords :
cavity resonators; dielectric measurement; dielectric resonators; measurement errors; closed cavity resonators; dielectric characterization; dielectric resonator methods; low-loss materials; measurement uncertainties; open cavity resonators; Air gaps; Anisotropic magnetoresistance; Crystalline materials; Dielectric materials; Dielectric measurements; Electric variables measurement; Fixtures; Frequency; Permittivity measurement; Polarization;
Journal_Title :
Dielectrics and Electrical Insulation, IEEE Transactions on
