DocumentCode :
1417799
Title :
Grasping SOI floating-body effects
Author :
Krishnan, Srinath ; Fossum, Jerry G.
Author_Institution :
Technol. Dev. Group, AMD, Sunnyvale, CA, USA
Volume :
14
Issue :
4
fYear :
1998
fDate :
7/1/1998 12:00:00 AM
Firstpage :
32
Lastpage :
37
Abstract :
It is important to understand what the floating-body effects are and how they affect device and circuit behavior. In this regard, this article qualitatively explains the device physics underlying DC and transient floating-body effects, clearly implying their influence on circuits, and thereby giving good insight into PD/SOI CMOS design issues. The article also notes special but practical device and circuit designs for controlling floating-body effects, showing through simulation how PD/SOI offers a significant performance advantage over bulk silicon in low-voltage applications, thereby conveying an assurance that reliable SOI CMOS design is feasible
Keywords :
CMOS integrated circuits; ULSI; integrated circuit design; silicon-on-insulator; transients; CMOS design; DC effects; SOI floating-body effects; ULSI; device physics; low-voltage applications; transient effects; CMOS process; CMOS technology; Circuit synthesis; Electric breakdown; Fabrication; MOS devices; MOSFETs; Partial discharges; Threshold voltage; Ultra large scale integration;
fLanguage :
English
Journal_Title :
Circuits and Devices Magazine, IEEE
Publisher :
ieee
ISSN :
8755-3996
Type :
jour
DOI :
10.1109/101.708479
Filename :
708479
Link To Document :
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