• DocumentCode
    1417846
  • Title

    The relevance of fT and fmax for the speed of a bipolar CE amplifier stage

  • Author

    Hurkx, G.A.M.

  • Author_Institution
    Philips Res. Lab., Eindhoven, Netherlands
  • Volume
    44
  • Issue
    5
  • fYear
    1997
  • fDate
    5/1/1997 12:00:00 AM
  • Firstpage
    775
  • Lastpage
    781
  • Abstract
    Expressions relating the bandwidth of a common-emitter (CE) amplifier stage and the small-signal CML gate delay time to directly measurable transistor parameters, such as fT, fmax, and input bandwidth fυ, are presented. They are valid for an arbitrary division of the base resistance and base-collector depletion capacitance into internal and external components. No resistance measurements are needed. It is shown that the transistor input bandwidth fυ is an important figure of merit for the speed of a CE stage. Under a given bias condition, fυ is determined by the base resistance and the cut-off frequency. In most cases the value of the maximum oscillation frequency fmax is only of minor importance. It would therefore be more meaningful to present besides fT also fυ instead of fmax as a figure of merit for transistors for high-speed, low-power analog and digital circuits
  • Keywords
    amplifiers; bipolar analogue integrated circuits; circuit analysis computing; current-mode logic; delays; integrated circuit modelling; analogue amplifier; base resistance; base-collector depletion capacitance; bias condition; bipolar common-emitter amplifier stage speed; cutoff frequency; directly measurable transistor parameters; figure of merit; high-speed low-power circuits; input bandwidth; maximum frequency of oscillation; modelling; numerical simulation; small-signal CML gate delay time; Bandwidth; Capacitance measurement; Circuits; Cutoff frequency; Delay effects; Differential amplifiers; Electrical resistance measurement; Particle measurements; Time measurement; Voltage;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/16.568039
  • Filename
    568039