• DocumentCode
    1417894
  • Title

    Analysis of current conduction in short-channel accumulation-mode SOI PMOS devices

  • Author

    Su, Ker-Wei ; Kuo, James B.

  • Author_Institution
    Dept. of Electr. Eng., Nat. Taiwan Univ., Taipei, Taiwan
  • Volume
    44
  • Issue
    5
  • fYear
    1997
  • fDate
    5/1/1997 12:00:00 AM
  • Firstpage
    832
  • Lastpage
    840
  • Abstract
    This paper reports a compact analytical current conduction model for short-channel accumulation-mode SOI PMOS devices. Based on the study, the current conduction mechanism in a short-channel accumulation-mode SOI PMOS device is different from that in a long-channel one. As verified by the experimental data, the compact analytical model considering channel length modulation and prepinchoff velocity saturation gives an accurate prediction of the drain current characteristics
  • Keywords
    MOSFET; carrier mobility; current distribution; semiconductor device models; silicon-on-insulator; analytical current conduction model; carrier mobility; channel length modulation; current conduction mechanism; drain current characteristics; prepinchoff velocity saturation; short-channel accumulation-mode SOI PMOS devices; Analytical models; Circuits; Electron mobility; MOS devices; Permittivity; Semiconductor process modeling; Substrates; Thin film devices; Transistors; Voltage;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/16.568046
  • Filename
    568046