Title :
A Feature-Based Solution to Forward Problem in Electrical Capacitance Tomography of Conductive Materials
Author :
Abdelrahman, Mohamed A. ; Gupta, Ankush ; Deabes, Wael A.
Author_Institution :
Frank H. Dotterweich Coll. of Eng., Texas A&M Univ.-Kingsville, Kingsville, TX, USA
Abstract :
A new feature-based technique is introduced to solve the nonlinear forward problem (FP) of the electrical capacitance tomography with the target application of monitoring the metal fill profile in the lost foam casting process. The new technique is based on combining a linear solution to the FP and a correction factor (CF). The CF is estimated using an artificial neural network (ANN) trained using key features extracted from the metal distribution. The CF adjusts the linear solution of the FP to account for the nonlinear effects caused by the shielding effects of the metal. This approach shows promising results and avoids the curse of dimensionality through the use of features and not the actual metal distribution to train the ANN. The ANN is trained using nine features extracted from the metal distributions as input. The expected sensors readings are generated using ANSYS software. The performance of the ANN for the training and testing data was satisfactory, with an average root-mean-square error equal to 2.2%.
Keywords :
capacitance measurement; conducting materials; feature extraction; lost foam casting; mean square error methods; metalworking; neural nets; process monitoring; production engineering computing; tomography; ANN; ANSYS software; artificial neural network; conductive material; correction factor; electrical capacitance tomography; feature extraction; lost foam casting process; metal distribution; metal fill profile monitoring; nonlinear FP; nonlinear forward problem; root mean square error method; Artificial neural networks; Capacitance; Electrodes; Feature extraction; Imaging; Metals; Sensitivity; Artificial neural network (ANN); electrical capacitance tomography (ECT); forward problem (FP); lost foam casting (LFC);
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
DOI :
10.1109/TIM.2010.2049224