Title :
Defect level evaluation in an IC design environment
Author :
De Sousa, José Teixeira ; Gonçalves, Fernando M. ; Teixeira, J. Paulo ; Marzocca, Cristoforo ; Corsi, Francesco ; Williams, T.W.
Author_Institution :
Tech. Univ. Lisbon, Portugal
fDate :
10/1/1996 12:00:00 AM
Abstract :
The purpose of this paper is to present a methodology for the evaluation of the Defect Level in an IC design environment. The methodology is based on the extension of Williams-Brown formula to nonequiprobable faults, which are collected from the IC layout, using the information on a typical IC process line defect statistics. The concept of weighted fault coverage is introduced, and the Defect Level (DL) evaluated for the Poisson and the negative binomial yield models. It is shown that DL depends on the critical areas associated with undetected faults, and their correspondent defect densities. Simulation results are presented, which highlight that the classic single Line Stuck-At (LSA) fault coverage is a unreliable metric of test quality. Moreover, results show that the efficiency of a given set of test patterns strongly depends on the physical design and defect statistics
Keywords :
Poisson distribution; binomial distribution; fault diagnosis; integrated circuit layout; integrated circuit testing; integrated circuit yield; production testing; quality control; statistical analysis; IC design environment; IC layout; IC process line; Poisson yield model; Williams-Brown formula; defect densities; defect level evaluation; defect statistics; negative binomial yield model; nonequiprobable faults; physical design; test patterns; test quality; weighted fault coverage; Circuit faults; Circuit testing; Consumer electronics; Delay estimation; Equations; Integrated circuit layout; Integrated circuit testing; Probability; Production; Yield estimation;
Journal_Title :
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
