DocumentCode :
1418158
Title :
New Set/Reset Scheme for Excellent Uniformity in Bipolar Resistive Memory
Author :
Park, Jubong ; Jo, Minseok ; Jung, Seungjae ; Lee, Joonmyoung ; Lee, Wootae ; Kim, Seonghyun ; Park, Sangsu ; Shin, Jungho ; Hwang, Hyunsang
Author_Institution :
Sch. of Mater. Sci. & Eng., Gwangju Inst. of Sci. & Technol., Gwangju, South Korea
Volume :
32
Issue :
3
fYear :
2011
fDate :
3/1/2011 12:00:00 AM
Firstpage :
228
Lastpage :
230
Abstract :
We proposed a new set/reset operation scheme to improve the switching uniformity of filament-type resistive memory. By controlling the magnitude of the sweep voltage in the pulse-sweep mode at each set and reset operation, similar resistance of a conducting filament in a low-resistance state and a homogeneously dissolved conducting filament in high resistance state were obtained continuously. As compared with a normal operation scheme involving a fixed voltage, our new operation scheme exhibits dramatically improved switching uniformity. By combining the new operation scheme with a gradual reset operation, we successfully achieved a stable multibit operation.
Keywords :
bipolar memory circuits; random-access storage; bipolar resistive memory; conducting filament; filament-type resistive memory; low-resistance state; pulse-sweep mode; resistive random- access memory; set-reset scheme; switching uniformity; Pulse magnitude modification; resistive random-access memory (RRAM); uniformity;
fLanguage :
English
Journal_Title :
Electron Device Letters, IEEE
Publisher :
ieee
ISSN :
0741-3106
Type :
jour
DOI :
10.1109/LED.2010.2094599
Filename :
5680582
Link To Document :
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