Lookup-table-based background linearization for VCO-based ADCs

Author

McNeill, John ; Majidi, Rabeeh ; Jianping Gong ; Chengxin Liu

Author_Institution

ECE Dept., Worcester Polytech. Inst., Worcester, MA, USA

fYear

2014

fDate

15-17 Sept. 2014

Firstpage

1

Lastpage

4

Abstract

A lookup-table digital correction technique enabled by the “Split ADC” calibration approach is described for linearization of VCO-based ADCs. Measured results for a prototype design with 10b resolution in a 180nm CMOS process show ENOB improved to 9.41b from an uncorrected 3.5b. The background LMS calibration procedure is tolerant of different input signals and corrects linearity over the entire range covered by the input signal excursion. An input dither of 3% of the ADC reference allows absolute accuracy in scale factor calibration.

Keywords

CMOS integrated circuits; analogue-digital conversion; calibration; integrated circuit design; least mean squares methods; linearisation techniques; table lookup; voltage-controlled oscillators; CMOS process; VCO based ADC; background LMS calibration procedure; lookup table based background linearization; lookup table digital correction technique; size 180 nm; split ADC calibration; CMOS integrated circuits; CMOS process; Calibration; Least squares approximations; Linearity; Table lookup; Voltage-controlled oscillators;

fLanguage

English

Publisher

ieee

Conference_Titel

Custom Integrated Circuits Conference (CICC), 2014 IEEE Proceedings of the

Conference_Location

San Jose, CA

Type

conf

DOI

10.1109/CICC.2014.6945991

Filename

6945991