• DocumentCode
    1418530
  • Title

    Computation of the short-term flicker severity index

  • Author

    Keppler, Thomas ; Watson, Neville ; Arrillaga, Jos

  • Author_Institution
    Dept. of Electr. & Electron. Eng., Canterbury Univ., Christchurch, New Zealand
  • Volume
    15
  • Issue
    4
  • fYear
    2000
  • fDate
    10/1/2000 12:00:00 AM
  • Firstpage
    1110
  • Lastpage
    1115
  • Abstract
    Short-term flicker severity (Pst) is an important electric power quality index defined by the International Electrotechnical Commission (IEC). Pst results from the statistical evaluation of flicker over short periods of time producing an objective measure for flicker originating from various types of sources. This paper reviews previous methods for computing Pst and proposes a new iterative algorithm. The algorithm is computationally efficient and shown to comply with the IEC standard
  • Keywords
    iterative methods; power supply quality; statistical analysis; IEC standard; International Electrotechnical Commission; electric power quality index; flickermeter; iterative algorithm; short-term flicker severity index; statistical evaluation; Electric variables measurement; Helium; Humans; IEC standards; Iterative algorithms; Power measurement; Power quality; Probability; Time measurement; Voltage fluctuations;
  • fLanguage
    English
  • Journal_Title
    Power Delivery, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0885-8977
  • Type

    jour

  • DOI
    10.1109/61.891490
  • Filename
    891490
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1418530