Title :
Computation of the short-term flicker severity index
Author :
Keppler, Thomas ; Watson, Neville ; Arrillaga, Jos
Author_Institution :
Dept. of Electr. & Electron. Eng., Canterbury Univ., Christchurch, New Zealand
fDate :
10/1/2000 12:00:00 AM
Abstract :
Short-term flicker severity (Pst) is an important electric power quality index defined by the International Electrotechnical Commission (IEC). Pst results from the statistical evaluation of flicker over short periods of time producing an objective measure for flicker originating from various types of sources. This paper reviews previous methods for computing Pst and proposes a new iterative algorithm. The algorithm is computationally efficient and shown to comply with the IEC standard
Keywords :
iterative methods; power supply quality; statistical analysis; IEC standard; International Electrotechnical Commission; electric power quality index; flickermeter; iterative algorithm; short-term flicker severity index; statistical evaluation; Electric variables measurement; Helium; Humans; IEC standards; Iterative algorithms; Power measurement; Power quality; Probability; Time measurement; Voltage fluctuations;
Journal_Title :
Power Delivery, IEEE Transactions on