• DocumentCode
    141860
  • Title

    A 500nA quiescent current, trim-free, ±1.75% absolute accuracy, CMOS-only voltage reference based on anti-doped N-channel MOSFETs

  • Author

    Al-Shyoukh, Mohammad ; Kalnitsky, Alex

  • Author_Institution
    TSMC, Austin, TX, USA
  • fYear
    2014
  • fDate
    15-17 Sept. 2014
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    In this paper, an ultra low power CMOS-only voltage reference is presented. The reference exploits the work function difference between anti-doped (flipped-gate) and standard-doped nMOS devices. These devices require no additional processing and are realizable from the basic N+ and P+ implants used to implement the standard enhancement mode MOS devices on the process. The reference is implemented as a temperature-compensated ΔVgs between anti-doped and standard-doped nMOS devices. Integrated on 0.18μm CMOS, the reference occupies less than 0.04mm2 on silicon, requires less than 500nA of quiescent current, and has a trim-free accuracy of ±1.75% which is comparable to that of the most well-behaved voltage references employing BJTs.
  • Keywords
    CMOS integrated circuits; MOSFET circuits; reference circuits; work function; BJTs; N+ implants; P+ implants; anti-doped N-channel MOSFETs; current 500 nA; size 0.18 mum; standard enhancement mode MOS devices; standard-doped nMOS devices; temperature-compensation; ultra low power CMOS-only voltage reference; work function; Accuracy; CMOS integrated circuits; Logic gates; MOS devices; Resistance; Silicon; Temperature measurement; Anti-Doped; CMOS Voltage Reference; Low Quiescent Current; Trim; Trim-Free; Work-Function;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Custom Integrated Circuits Conference (CICC), 2014 IEEE Proceedings of the
  • Conference_Location
    San Jose, CA
  • Type

    conf

  • DOI
    10.1109/CICC.2014.6946007
  • Filename
    6946007