DocumentCode :
1418857
Title :
Empirical Mode Decomposition Analysis for Visual Stylometry
Author :
Hughes, James M. ; Mao, Dong ; Rockmore, Daniel N. ; Wang, Yang ; Wu, Qiang
Author_Institution :
Dept. of Comput. Sci., Dartmouth Coll., Hanover, NH, USA
Volume :
34
Issue :
11
fYear :
2012
Firstpage :
2147
Lastpage :
2157
Abstract :
In this paper, we show how the tools of empirical mode decomposition (EMD) analysis can be applied to the problem of “visual stylometry,” generally defined as the development of quantitative tools for the measurement and comparisons of individual style in the visual arts. In particular, we introduce a new form of EMD analysis for images and show that it is possible to use its output as the basis for the construction of effective support vector machine (SVM)-based stylometric classifiers. We present the methodology and then test it on collections of two sets of digital captures of drawings: a set of authentic and well-known imitations of works attributed to the great Flemish artist Pieter Bruegel the Elder (1525-1569) and a set of works attributed to Dutch master Rembrandt van Rijn (1606-1669) and his pupils. Our positive results indicate that EMD-based methods may hold promise generally as a technique for visual stylometry.
Keywords :
art; image classification; support vector machines; EMD analysis; SVM; drawing digital captures; empirical mode decomposition analysis; support vector machine-based stylometric classifiers; visual arts; visual stylometry; Art; Electronic mail; Kernel; Shape; Vectors; Visualization; Wavelet analysis; Empirical mode decomposition; classifier; image processing.; stylometry;
fLanguage :
English
Journal_Title :
Pattern Analysis and Machine Intelligence, IEEE Transactions on
Publisher :
ieee
ISSN :
0162-8828
Type :
jour
DOI :
10.1109/TPAMI.2012.16
Filename :
6127875
Link To Document :
بازگشت