Title :
Discussion of "Two new methods for very fast fault type detection by means of parameter fitting and artificial neural networks" [Closure to discussion]
Author :
Funabashi, Toshihisa ; Frohlich, K.
Author_Institution :
Meidensha Corp., Tokyo, Japan
Abstract :
The author discusses the original paper ("Two new methods for very fast fault type detection by means of parameter fitting and artificial neural networks", A. Poetl et al., see ibid., vol. 14, no. 4, p. 1269-75, 1999) and presents his observations. The original authors\´ response to the discussion is also included.
Keywords :
EMTP; fault diagnosis; neural nets; power system analysis computing; power system faults; EMTP; artificial neural networks; computer simulation; parameter fitting; power systems; very fast fault type detection; Capacitors; Fault detection; Frequency; Power quality; Power system faults; Power system harmonics; Power system protection; Switches; Wavelet domain; Wavelet transforms;
Journal_Title :
Power Delivery, IEEE Transactions on
