DocumentCode
1418862
Title
Discussion of "Two new methods for very fast fault type detection by means of parameter fitting and artificial neural networks" [Closure to discussion]
Author
Funabashi, Toshihisa ; Frohlich, K.
Author_Institution
Meidensha Corp., Tokyo, Japan
Volume
15
Issue
4
fYear
2000
Firstpage
1344
Lastpage
1345
Abstract
The author discusses the original paper ("Two new methods for very fast fault type detection by means of parameter fitting and artificial neural networks", A. Poetl et al., see ibid., vol. 14, no. 4, p. 1269-75, 1999) and presents his observations. The original authors\´ response to the discussion is also included.
Keywords
EMTP; fault diagnosis; neural nets; power system analysis computing; power system faults; EMTP; artificial neural networks; computer simulation; parameter fitting; power systems; very fast fault type detection; Capacitors; Fault detection; Frequency; Power quality; Power system faults; Power system harmonics; Power system protection; Switches; Wavelet domain; Wavelet transforms;
fLanguage
English
Journal_Title
Power Delivery, IEEE Transactions on
Publisher
ieee
ISSN
0885-8977
Type
jour
DOI
10.1109/61.891567
Filename
891567
Link To Document