Title :
Enhancement-Mode Operation of Nanochannel Array (NCA) AlGaN/GaN HEMTs
Author :
Liu, Shenghou ; Cai, Yong ; Gu, Guodong ; Wang, Jinyan ; Zeng, Chunhong ; Shi, Wenhua ; Feng, Zhihong ; Qin, Hua ; Cheng, Zhiqun ; Chen, Kevin J. ; Zhang, Baoshun
Author_Institution :
Suzhou Inst. of Nano-tech & Nano-bionics, Suzhou, China
fDate :
3/1/2012 12:00:00 AM
Abstract :
In this letter, enhancement-mode (E-mode) AlGaN/ GaN high electron mobility transistors (HEMTs) were demon- strated based on lateral scaling of the 2-D electron gas channel using nanochannel array (NCA) structure. The NCA structure consists of multiple parallel channels with nanoscale width defined by electron-beam lithography and dry etching. Because of the improved gate control from the channel sidewalls and partially relaxed piezoelectric polarization, the fabricated 2 μm-gate-length NCA-HEMT with a nanochannel width of 64 nm showed a thresh- old voltage of +0.6 V and a higher extrinsic transconductance of 123 mS/mm, compared to -1.6 V and 106 mS/mm for the conventional HEMT with μm-scale channel width. The scaling of threshold voltages, peak transconductance, and gate leakage as a function of the nanochannel width were investigated. Small-signal RF performance of NCA-HEMTs were characterized for the first time and compared with those of conventional HEMTs.
Keywords :
III-V semiconductors; aluminium compounds; gallium compounds; high electron mobility transistors; wide band gap semiconductors; 2-D electron gas channel; AlGaN-GaN; NCA; dry etching; electron-beam lithography; enhancement-mode operation; high electron mobility transistors; high extrinsic transconductance; nanochannel array HEMT; piezoelectric polarization; size 2 mum; size 64 nm; small-signal RF performance; voltage -1.6 V; voltage 0.6 V; Aluminum gallium nitride; Gallium nitride; HEMTs; Logic gates; MODFETs; Threshold voltage; Transconductance; AlGaN/GaN high electron mobility transistor (HEMT); enhancement-mode (E-mode); high-frequency; nanochannel array (NCA);
Journal_Title :
Electron Device Letters, IEEE
DOI :
10.1109/LED.2011.2179003