Title :
Two-Dimensional Flex Sensor Exploiting Stacked Ultrathin Chips
Author :
Endler, Stefan ; Ferwana, Saleh ; Rempp, Horst ; Harendt, Christine ; Burghartz, Joachim N.
Author_Institution :
Inst. for Microelectron. Stuttgart (IMS CHIPS), Stuttgart, Germany
fDate :
3/1/2012 12:00:00 AM
Abstract :
A new concept for mechanically flexible stress and flex sensors is presented. A stack of two ultrathin chips is exploited to compensate both thermal effects and the vertical piezoresistive effect. By tailoring the thickness of the top die, the active devices of the bottom chip become stress compensated, whereas the devices of the top chip receive maximum stress. The structural arrangement enforces that the apparent vertical stresses and the temperatures of both dies are basically identical. Thus, the differential signal of both dies provides a temperature-compensated information about the 2-D stress and flexure.
Keywords :
flexible electronics; piezoresistive devices; sensors; 2D stress; apparent vertical stress; bottom chip device; maximum stress compensation; mechanically flexible stress concept; stacked ultrathin chip; structural arrangement; temperature-compensated information; thermal effect; top die thickness; two-dimensional flex sensor; vertical piezoresistive effect; MOSFETs; Piezoresistance; Silicon; Stress; Stress measurement; Temperature dependence; Temperature sensors; Flexible electronics; piezoresistive devices; stress measurement; ultrathin chips;
Journal_Title :
Electron Device Letters, IEEE
DOI :
10.1109/LED.2011.2178389