DocumentCode
1419099
Title
Determination of Laplace-Poisson domain interface within semiconductor devices
Author
Magowan, J.A. ; Ryan, W.D. ; Armstrong, A.
Author_Institution
Queen´´s University of Belfast, Department of Electrical Engineering, Belfast, UK
Volume
117
Issue
5
fYear
1970
fDate
5/1/1970 12:00:00 AM
Firstpage
921
Lastpage
926
Abstract
A method is described for locating the interface boundary between the space-charge-neutral regions in semiconductor devices. This is based on a two-dimensional S.O.R. solution of Poisson´s equation for complete depletion within the space-charge region and Laplace´s equation within the neutral region. Applications of this 2-dimensional analytical technique are considered, and particular reference is made to the junction field-effect transistor and the metal-oxide-silicon transistor.
Keywords
semiconductor devices; space charge;
fLanguage
English
Journal_Title
Electrical Engineers, Proceedings of the Institution of
Publisher
iet
ISSN
0020-3270
Type
jour
DOI
10.1049/piee.1970.0182
Filename
5248874
Link To Document