Title :
An Optimum Land Cover Mapping Algorithm in the Presence of Shadows
Author :
Kasetkasem, Teerasit ; Varshney, Pramod K.
Author_Institution :
Center of Promoting R&D of Satellite Image Applic. in Agric. & Dept. of Electr. Eng. Fac. of Eng., Kasetsart Univ., Bangkok, Thailand
fDate :
6/1/2011 12:00:00 AM
Abstract :
Occurrence of shadowy pixels in remote sensing images is a common phenomenon particularly with passive sensors. In these cases, analysts may mistakenly treat these pixels as a separate land cover class. This may result in the loss of information present in the shadow pixels A better approach may be to correct light intensity values in shadowy pixels and use the light-corrected image to produce the land cover map. Most light intensity correction algorithms are not designed to optimize classification performance. Consequently, the accuracy of the resulting land cover map may be degraded. To address this problem, this paper proposes an algorithm that employs the maximum a posteriori criterion for classifying a multispectral image in the presence of shadows. The observed image is assumed to be the product of a shadow-free image with a light intensity image along with an additive measurement noise. The main purpose of this algorithm is to find the most likely land cover map along with the shadow-free image and light intensity image as byproducts. Our results show that a large number of misclassified pixels can be corrected. Furthermore, in the shadow-free image, the materials in the shadowy regions can also be successfully reconstructed.
Keywords :
geophysical image processing; image classification; maximum likelihood estimation; terrain mapping; additive measurement noise; light intensity correction algorithms; light-corrected image; maximum a posteriori criterion; misclassified pixel correction; multispectral image classification; optimum land cover mapping algorithm; remote sensing images; shadowy pixels; Accuracy; Algorithm design and analysis; Classification algorithms; Pixel; Reflectivity; Remote sensing; Silicon; Image classification; Markov random fields; image reconstruction; land cover mapping; remote sensing; shadow removal; simulated annealing;
Journal_Title :
Selected Topics in Signal Processing, IEEE Journal of
DOI :
10.1109/JSTSP.2010.2103923