• DocumentCode
    1419205
  • Title

    Multitone characterization and design of FET resistive mixers based on combined active source-pull/load-pull techniques

  • Author

    Le, Di-Luan ; Ghannouchi, Fadhel M.

  • Author_Institution
    Farinon Div., Harris Corp., Dollard-des-Ormeaux, Que., Canada
  • Volume
    46
  • Issue
    9
  • fYear
    1998
  • fDate
    9/1/1998 12:00:00 AM
  • Firstpage
    1201
  • Lastpage
    1208
  • Abstract
    A dual six-port-based measurement setup was developed to synthesize five source and load impedances simultaneously. The setup can perform nonlinear measurements with multifrequency excitation. Active source-pull/load-pull measurements obtained for an NE-9001 transistor operated in a C-band field-effect transistor (FET) resistive mixer mode allow one to optimize the linearity of the mixer while maintaining a typical conversion loss of approximately 7 dB. Two-tone verification at 3.9000 and 3.9005 GHz showed that the level of in-band third-order intermodulation products could be reduced to -50 dBc, with a well-chosen output intermediate frequency (IF) load impedance and sufficient local oscillator (LO) power. The measured performance of the realized mixer is in good agreement with that predicted at the transistor characterization step of the design
  • Keywords
    field effect transistor circuits; intermodulation; microwave measurement; microwave mixers; multiport networks; 3.9000 GHz; 3.9005 GHz; 7 dB; C-band; FET resistive mixer; IF load impedance; NE-9001 transistor; active load-pull measurement; active source-pull measurement; conversion loss; design; dual six-port measurement; in-band intermodulation; local oscillator; multifrequency excitation; multitone measurement; nonlinear measurement; source impedance; Design automation; Frequency; Impedance measurement; Instruments; Local oscillators; Microwave FETs; Mixers; Power measurement; Testing; Tuners;
  • fLanguage
    English
  • Journal_Title
    Microwave Theory and Techniques, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9480
  • Type

    jour

  • DOI
    10.1109/22.709457
  • Filename
    709457