• DocumentCode
    1419272
  • Title

    Location of Wire Faults Using Chaotic Signal

  • Author

    Wang, Anbang ; Zhang, Mingjiang ; Xu, Hang ; Wang, Yuncai

  • Author_Institution
    Dept. of Phys. & Optoelectron., Taiyuan Univ. of Technol., Taiyuan, China
  • Volume
    32
  • Issue
    3
  • fYear
    2011
  • fDate
    3/1/2011 12:00:00 AM
  • Firstpage
    372
  • Lastpage
    374
  • Abstract
    We propose a method for testing wire fault using a chaotic signal. The fault is detected by correlating the chaotic signal back-reflected from the fault with its delayed duplicate. Centimeter-level spatial resolution and antijamming can be achieved, benefiting from the broadband and randomness of the chaotic waveform. We experimentally proved that our method can be used to locate the impedance discontinuities of several different kinds of electric cables. Preliminary experiments obtained 0.5-m resolution with a data acquisition bandwidth of 120 MHz. Further, we demonstrate the ability for testing live wires using our method.
  • Keywords
    cables (electric); chaos; circuit testing; electric impedance; fault location; wires (electric); antijamming; bandwidth 120 MHz; centimeter-level spatial resolution; chaotic signal; chaotic waveform; data acquisition bandwidth; delayed duplicate; electric cable; fault detection; impedance discontinuity; wire fault location; wire fault testing; Chaos; fault location; semiconductor lasers; time domain reflectometry (TDR);
  • fLanguage
    English
  • Journal_Title
    Electron Device Letters, IEEE
  • Publisher
    ieee
  • ISSN
    0741-3106
  • Type

    jour

  • DOI
    10.1109/LED.2010.2097237
  • Filename
    5680939