DocumentCode
1419272
Title
Location of Wire Faults Using Chaotic Signal
Author
Wang, Anbang ; Zhang, Mingjiang ; Xu, Hang ; Wang, Yuncai
Author_Institution
Dept. of Phys. & Optoelectron., Taiyuan Univ. of Technol., Taiyuan, China
Volume
32
Issue
3
fYear
2011
fDate
3/1/2011 12:00:00 AM
Firstpage
372
Lastpage
374
Abstract
We propose a method for testing wire fault using a chaotic signal. The fault is detected by correlating the chaotic signal back-reflected from the fault with its delayed duplicate. Centimeter-level spatial resolution and antijamming can be achieved, benefiting from the broadband and randomness of the chaotic waveform. We experimentally proved that our method can be used to locate the impedance discontinuities of several different kinds of electric cables. Preliminary experiments obtained 0.5-m resolution with a data acquisition bandwidth of 120 MHz. Further, we demonstrate the ability for testing live wires using our method.
Keywords
cables (electric); chaos; circuit testing; electric impedance; fault location; wires (electric); antijamming; bandwidth 120 MHz; centimeter-level spatial resolution; chaotic signal; chaotic waveform; data acquisition bandwidth; delayed duplicate; electric cable; fault detection; impedance discontinuity; wire fault location; wire fault testing; Chaos; fault location; semiconductor lasers; time domain reflectometry (TDR);
fLanguage
English
Journal_Title
Electron Device Letters, IEEE
Publisher
ieee
ISSN
0741-3106
Type
jour
DOI
10.1109/LED.2010.2097237
Filename
5680939
Link To Document