Title :
Evolution of Self-Assembled InGaAs Tandem Nanostructures Consisting a Hole and Pyramid on Type-A High-Index GaAs Substrates by Droplet Epitaxy
Author :
Lee, Jihoon ; Wang, Zhiming ; Kim, Eun-Soo ; Kim, Nam-Young ; Park, Seung-Hyun ; Salamo, Gregory J.
Author_Institution :
Dept. of Electron. Eng., Kwangwoon Univ., Seoul, South Korea
fDate :
5/1/2011 12:00:00 AM
Abstract :
The evolution of self-assembled InGaAs tandem nanostructures consisting a hole and pyramid is demonstrated using droplet epitaxy on various type-A high-index GaAs surfaces: (3 1 1)A (4 1 1)A, (5 1 1)A and (7 1 1)A. Under an identical fabrication condition depending on the index of surfaces, the resulting density and size of nanostructures are characteristic. The variation of density and size of nanostructures is explained with the relationship of the density of monolayer steps. An empirical model that describes the mechanism of self-assembled tandem nanostructures consisting a hole and pyramid is suggested as the concurrent occurrence of intermixing between droplets and substrate, dissolution of substrate and anisotropic surface diffusion.
Keywords :
III-V semiconductors; atomic force microscopy; dissolving; drops; gallium arsenide; indium compounds; molecular beam epitaxial growth; monolayers; nanofabrication; nanostructured materials; self-assembly; semiconductor growth; surface diffusion; GaAs; InGaAs; anisotropic surface diffusion; droplet epitaxy; empirical model; fabrication condition; intermixing; monolayer steps; self-assembled InGaAs tandem nanostructures; substrate dissolution; surface index; type-A high-index GaAs substrates; type-A high-index GaAs surfaces; Epitaxial growth; Fabrication; Gallium arsenide; Indium gallium arsenide; Nanostructured materials; Permission; Self-assembly; Semiconductor nanostructures; Substrates; Surface reconstruction; Atomic force microscopy (AFM); GaAs type-A high-index surfaces; droplet epitaxy (DE); molecular beam epitaxy (MBE); tandem nanostructures;
Journal_Title :
Nanotechnology, IEEE Transactions on
DOI :
10.1109/TNANO.2010.2042725