DocumentCode
1419632
Title
COCA: a novel 3-D FE simulator for the design of TWT´s multistage collectors
Author
Coco, Salvatore ; Emma, Francesco ; Laudani, Antonio ; Pulvirenti, Sabrina ; Sergi, Mirko
Author_Institution
Ist. di Elettro, Elettronica e Sistemistico, Catania Univ., Italy
Volume
48
Issue
1
fYear
2001
fDate
1/1/2001 12:00:00 AM
Firstpage
24
Lastpage
31
Abstract
In this paper, the simulator COCA, a novel fully three-dimensional (3-D) finite-element (FE) tool for the design of multistage depressed TWTs collectors is illustrated. COCA has been developed at the University of Catania under an ESA/ESTEC project. The complete simulator consists of three main modules: a fully 3-D deterministic/neural FE mesh generator, an FE Vlasov solver coupled with an electron trajectory tracer taking into account also external magnetic fields, and a postprocessing module for result restitution, including secondary electron emission effects. All the functions are interactively managed and executed by means of an especially developed user-friendly graphical user interface which controls all the various aspects of a simulation session. The results of a simulation test performed on an asymmetric collector are also reported showing excellent agreement with available measured data. The COCA simulator provides the user with flexible and effective tools to design, test, optimize, and verify innovative asymmetrical geometries for TWT collectors
Keywords
digital simulation; electronic design automation; finite element analysis; magnetic fields; secondary electron emission; travelling wave tubes; 3D FE simulator; COCA; TWT; Vlasov solver; asymmetric collector; deterministic/neural FE mesh generator; electron trajectory tracer; external magnetic fields; multistage collectors; postprocessing module; secondary electron emission effects; simulation test; user-friendly graphical user interface; Couplings; Design optimization; Electron emission; Finite element methods; Graphical user interfaces; Iron; Mesh generation; Performance evaluation; Solid modeling; Testing;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/16.892163
Filename
892163
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