• DocumentCode
    1419656
  • Title

    Computer simulation of ion trapping and detrapping in a PPM focused traveling wave tube

  • Author

    Thorington, Charles B.

  • Author_Institution
    Boeing Electron. Dynamics Devices Inc., Torrance, CA, USA
  • Volume
    48
  • Issue
    1
  • fYear
    2001
  • fDate
    1/1/2001 12:00:00 AM
  • Firstpage
    56
  • Lastpage
    61
  • Abstract
    This paper presents results from a time-dependent, electrostatic electron gun simulation code, simulating ion trapping and detrapping in a traveling wave tube (TWT) focused by periodic permanent magnets (PPM). The simulations described indicate that ion loss is primarily radial through the beam tunnel walls, rather than axial through the gun or collector. The electrostatic potential well formed by the electron beam is constantly being filled by ionization of a background neutral gas. This effect constitutes the primary ion loss mechanism. Filling of the potential well is made possible by loss of the low energy electrons produced by ionization (secondary electrons) through periodic nulls in the magnetic field
  • Keywords
    digital simulation; electron beam focusing; electron guns; particle traps; permanent magnets; travelling wave tubes; PPM focusing; background neutral gas ionisation; beam tunnel walls; electrostatic electron gun; electrostatic potential well; ion detrapping; ion loss; ion trapping; low energy electrons; periodic nulls; simulation code; traveling wave tube; Computational modeling; Computer simulation; Electron beams; Electron traps; Electron tubes; Electrostatics; Filling; Ionization; Permanent magnets; Potential well;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/16.892167
  • Filename
    892167