• DocumentCode
    1419699
  • Title

    Transient ion disturbances in traveling wave tubes

  • Author

    Tighe, William ; Goebel, Dan M. ; Thorington, Charles B.

  • Author_Institution
    Boeing Electron. Dynamic Devices Inc., Torrance, CA, USA
  • Volume
    48
  • Issue
    1
  • fYear
    2001
  • fDate
    1/1/2001 12:00:00 AM
  • Firstpage
    82
  • Lastpage
    87
  • Abstract
    It is well known that the presence of ions in the electron beam of a traveling wave tube (TWT) can lead to periodic variations in the output power, phase and the body (or helix) current. This has been referred to as ion noise or jitter. Recently, we have observed a different form of jitter, and while it is still observed as a small variation in the TWT output (typically <0.5 dB in power and 2° in phase), it is not periodic. We refer to this phenomenon as random jitter, since its random nature in time is a defining characteristic, Other characteristics include a relatively fast onset (~1 ms) and slow (~500 ms) recovery. It was found that random jitter was due to the spurious release of extremely small amounts of trapped gas inside the TWT. The source of the gas was identified and the problem was resolved. The observed level of fluctuations in power and phase had no effect on digital traffic and the small quantity of gas was found to have no measurable impact on cathode life
  • Keywords
    electron device noise; fluctuations; ions; jitter; transients; travelling wave tubes; Ar; Ar gas; TWT electron beam; body current; helix current; ion noise; nonperiodic variations; output power; phase fluctuations; phase variations; power fluctuations; random jitter; spurious gas release; transient ion disturbances; trapped gas; traveling wave tubes; Cathodes; Dielectrics; Electron beams; Electron traps; Electron tubes; Fluctuations; Jitter; Power generation; Power measurement; Radio frequency;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/16.892172
  • Filename
    892172