DocumentCode :
1419800
Title :
A Parametric Study of Inter-Track Interference in Bit Patterned Media Recording
Author :
Karakulak, Seyhan ; Siegel, Paul H. ; Wolf, Jack Keil
Author_Institution :
Center for Magn. Recording Res., Univ. of California San Diego, La Jolla, CA, USA
Volume :
46
Issue :
3
fYear :
2010
fDate :
3/1/2010 12:00:00 AM
Firstpage :
819
Lastpage :
824
Abstract :
We present a parametric study of inter-track interference (ITI) in the context of bit patterned media (BPM) recording channels. Bit error rate (BER) simulation results for optimal bit detection at moderate-to-high signal-to-noise-ratio (SNR) show that, in a certain range of ITI levels, increased ITI does not necessarily degrade performance. This observation applies to channels both with and without intersymbol interference (ISI) as well as in the absence and presence of track misregistration (TMR). In the case of no ISI, an exact analysis of the BER performance of optimal bit detection provides a complete explanation of the observed effect of ITI. For channels with ISI, error event analysis of a joint-track maximum-likelihood sequence detector provides insight into the observed impact of varying levels of ITI on BER performance.
Keywords :
error statistics; intersymbol interference; magnetic recording; maximum likelihood sequence estimation; BER; SNR; bit error rate; bit patterned media; error event analysis; inter-track interference; intersymbol interference; maximum-likelihood sequence detector; media recording; signal-to-noise-ratio; track misregistration; Bit error rate; Degradation; Detectors; Error analysis; Event detection; Intersymbol interference; Maximum likelihood detection; Parametric study; Performance analysis; Signal to noise ratio; Bit patterned media (BPM) recording; inter-track interference (ITI); intersymbol interference (ISI); track misregistration (TMR);
fLanguage :
English
Journal_Title :
Magnetics, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9464
Type :
jour
DOI :
10.1109/TMAG.2009.2037724
Filename :
5415773
Link To Document :
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