• DocumentCode
    1419800
  • Title

    A Parametric Study of Inter-Track Interference in Bit Patterned Media Recording

  • Author

    Karakulak, Seyhan ; Siegel, Paul H. ; Wolf, Jack Keil

  • Author_Institution
    Center for Magn. Recording Res., Univ. of California San Diego, La Jolla, CA, USA
  • Volume
    46
  • Issue
    3
  • fYear
    2010
  • fDate
    3/1/2010 12:00:00 AM
  • Firstpage
    819
  • Lastpage
    824
  • Abstract
    We present a parametric study of inter-track interference (ITI) in the context of bit patterned media (BPM) recording channels. Bit error rate (BER) simulation results for optimal bit detection at moderate-to-high signal-to-noise-ratio (SNR) show that, in a certain range of ITI levels, increased ITI does not necessarily degrade performance. This observation applies to channels both with and without intersymbol interference (ISI) as well as in the absence and presence of track misregistration (TMR). In the case of no ISI, an exact analysis of the BER performance of optimal bit detection provides a complete explanation of the observed effect of ITI. For channels with ISI, error event analysis of a joint-track maximum-likelihood sequence detector provides insight into the observed impact of varying levels of ITI on BER performance.
  • Keywords
    error statistics; intersymbol interference; magnetic recording; maximum likelihood sequence estimation; BER; SNR; bit error rate; bit patterned media; error event analysis; inter-track interference; intersymbol interference; maximum-likelihood sequence detector; media recording; signal-to-noise-ratio; track misregistration; Bit error rate; Degradation; Detectors; Error analysis; Event detection; Intersymbol interference; Maximum likelihood detection; Parametric study; Performance analysis; Signal to noise ratio; Bit patterned media (BPM) recording; inter-track interference (ITI); intersymbol interference (ISI); track misregistration (TMR);
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/TMAG.2009.2037724
  • Filename
    5415773