DocumentCode
141987
Title
Foreword
fYear
2014
fDate
13-17 April 2014
Firstpage
1
Lastpage
1
Abstract
Presents the introductory welcome message from the conference proceedings. May include the conference officers´ congratulations to all involved with the conference event and publication of the proceedings record.
fLanguage
English
Publisher
ieee
Conference_Titel
VLSI Test Symposium (VTS), 2014 IEEE 32nd
Conference_Location
Napa, CA, USA
Type
conf
DOI
10.1109/VTS.2014.6818732
Filename
6818732
Link To Document