DocumentCode
142000
Title
TTTC: Test technology technical council
fYear
2014
fDate
13-17 April 2014
Firstpage
1
Lastpage
3
Abstract
Provides a listing of current committee members and society officers.
fLanguage
English
Publisher
ieee
Conference_Titel
VLSI Test Symposium (VTS), 2014 IEEE 32nd
Conference_Location
Napa, CA, USA
Type
conf
DOI
10.1109/VTS.2014.6818737
Filename
6818737
Link To Document