DocumentCode
1420025
Title
Submicron AlInAs/InGaAs HBT with 160 GHz fT at 1 mA collector current
Author
Sokolich, M. ; Fields, C.H. ; Madhav, M.
Author_Institution
HRL Labs. LLC, Malibu, CA, USA
Volume
22
Issue
1
fYear
2001
Firstpage
8
Lastpage
10
Abstract
We have demonstrated a submicron heterojunction bipolar transistor (SHBT) with a unity current gain cutoff frequency (fT) of 160 GHz at the very low current level of 1 mA. The AlInAs/InGaAs SHBT has a thin collector and uses stepper lithography with 0.1 μm registration accuracy to reduce the parasitic elements that typically limit the performance of small transistors. The same device has 100 GHz fT at 200 μA. The result substantially improves upon the cutoff frequency of submicron compound semiconductor devices. The technology is appropriate for high speed, low power, high-density circuits.
Keywords
III-V semiconductors; aluminium compounds; gallium arsenide; heterojunction bipolar transistors; high-speed integrated circuits; indium compounds; lithography; millimetre wave bipolar transistors; 1 mA; 160 GHz; AlInAs-InGaAs; high speed circuits; high-density circuits; stepper lithography; submicron HBT; thin collector; unity current gain cutoff frequency; Appropriate technology; Bipolar transistors; Circuits; Cutoff frequency; Heterojunction bipolar transistors; Indium gallium arsenide; Lithography; Millimeter wave technology; Parasitic capacitance; Semiconductor devices;
fLanguage
English
Journal_Title
Electron Device Letters, IEEE
Publisher
ieee
ISSN
0741-3106
Type
jour
DOI
10.1109/55.892427
Filename
892427
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