• DocumentCode
    1420164
  • Title

    Simulation of SOI devices and circuits using BSIM3SOI

  • Author

    Sinitsky, D. ; Tang, S. ; Jangity, A. ; Assaderaghi, F. ; Shahidi, G. ; Chenming Hu

  • Author_Institution
    Dept. of Electr. Eng. & Comput. Sci., California Univ., Berkeley, CA, USA
  • Volume
    19
  • Issue
    9
  • fYear
    1998
  • Firstpage
    323
  • Lastpage
    325
  • Abstract
    A versatile SOI model derived from the BSIM3v3 bulk MOSFET model is capable of simulating partially and fully depleted devices with options for self-heating and floating body effects. The model can automatically switch between fully and partially depleted regimes. After refining body current models we for the first time present successful dc and transient device and circuit simulation of an SOI MOSFET technology with L/sub eff/ below 0.2 μm.
  • Keywords
    MOS integrated circuits; MOSFET; circuit analysis computing; digital simulation; semiconductor device models; silicon-on-insulator; transient analysis; 0.2 micron; BSIM3SOI; SOI devices; SOI model; body current models; bulk MOSFET model; dc simulation; floating body effects; fully depleted devices; partially depleted devices; self-heating effects; transient simulation; Circuit simulation; Data mining; Doping profiles; Impact ionization; MOSFET circuits; Pulse measurements; Semiconductor diodes; Semiconductor films; Semiconductor process modeling; Switches;
  • fLanguage
    English
  • Journal_Title
    Electron Device Letters, IEEE
  • Publisher
    ieee
  • ISSN
    0741-3106
  • Type

    jour

  • DOI
    10.1109/55.709628
  • Filename
    709628