DocumentCode
142026
Title
Alternative “safe” test of hysteretic power converters
Author
Wang, Xiongfei ; Blanchard, K. ; Estella, S. ; Chatterjee, Avhishek
Author_Institution
Georgia Inst. of Technol., Atlanta, GA, USA
fYear
2014
fDate
13-17 April 2014
Firstpage
1
Lastpage
6
Abstract
This paper presents a novel alternative “safe” test method for line and load regulation specifications of hysteretic controlled switching power converters. These specifications have not been tested in production before because the conventional measurement techniques lead to huge voltage spikes during switching transients. Those voltage spikes are caused by energy accumulation from parasitic inductances of ATE interface board to input capacitance of the device under test (DUT) and can damage DUT´s internal circuitries. The proposed alternative test approach offers a “safe” manufacturing test of load/line regulation specifications of hysteretic controlled switching power converters through a carefully altered feedback circuit and a current-limited load. Through injecting the altered feedback circuit with a carefully crafted stimulus, the load and line regulation specifications of DUT are accurately predicted. This test approach is facilitated by the use of a DAC for stimulus generation and ADC for DUT response capturing. Both simulated data and hardware measurements are used to demonstrate the viability of the proposed ”safe”testing method.
Keywords
switching convertors; ATE interface board; current limited load; device under test; feedback circuit; hysteretic controlled switching power converters; line regulation specifications; load regulation specifications; switching transients; voltage spikes; Equations; Load modeling; Predictive models; Switches; Testing; Voltage control; Voltage measurement; Alternative testing; DfT; buck converter test;
fLanguage
English
Publisher
ieee
Conference_Titel
VLSI Test Symposium (VTS), 2014 IEEE 32nd
Conference_Location
Napa, CA
Type
conf
DOI
10.1109/VTS.2014.6818751
Filename
6818751
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