• DocumentCode
    142026
  • Title

    Alternative “safe” test of hysteretic power converters

  • Author

    Wang, Xiongfei ; Blanchard, K. ; Estella, S. ; Chatterjee, Avhishek

  • Author_Institution
    Georgia Inst. of Technol., Atlanta, GA, USA
  • fYear
    2014
  • fDate
    13-17 April 2014
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    This paper presents a novel alternative “safe” test method for line and load regulation specifications of hysteretic controlled switching power converters. These specifications have not been tested in production before because the conventional measurement techniques lead to huge voltage spikes during switching transients. Those voltage spikes are caused by energy accumulation from parasitic inductances of ATE interface board to input capacitance of the device under test (DUT) and can damage DUT´s internal circuitries. The proposed alternative test approach offers a “safe” manufacturing test of load/line regulation specifications of hysteretic controlled switching power converters through a carefully altered feedback circuit and a current-limited load. Through injecting the altered feedback circuit with a carefully crafted stimulus, the load and line regulation specifications of DUT are accurately predicted. This test approach is facilitated by the use of a DAC for stimulus generation and ADC for DUT response capturing. Both simulated data and hardware measurements are used to demonstrate the viability of the proposed ”safe”testing method.
  • Keywords
    switching convertors; ATE interface board; current limited load; device under test; feedback circuit; hysteretic controlled switching power converters; line regulation specifications; load regulation specifications; switching transients; voltage spikes; Equations; Load modeling; Predictive models; Switches; Testing; Voltage control; Voltage measurement; Alternative testing; DfT; buck converter test;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Test Symposium (VTS), 2014 IEEE 32nd
  • Conference_Location
    Napa, CA
  • Type

    conf

  • DOI
    10.1109/VTS.2014.6818751
  • Filename
    6818751