Accelerating capture of infrequent errors on ATE for silicon TV tuners

Infrequent errors, such as unwanted glitches occurring once every a few seconds in silicon tuners, are very costly to capture in production due to long test time by the nature of the errors. The paper presents a novel scheme that reduces the test time from a few seconds to a few tens milliseconds. The scheme has been implemented to test millions of silicon TV tuners, and field defects caused by the glitches were successfully eliminated.