Title :
Ultrafast Refractometry for Characterization of Nanocomposite Material Systems
Author :
Collier, Christopher M. ; Jin, Xian ; Holzman, Jonathan F.
Author_Institution :
Univ. of British Columbia, Kelowna, BC, Canada
fDate :
4/1/2012 12:00:00 AM
Abstract :
An ultrafast refractometry technique is introduced for direct characterization of refractive indices, absorption coefficients, and refractive index variances in nanocomposite (NC) assemblies. The system samples bulk NC optical characteristics by probing phase delay, absorption, and spatial coherence effects on an ultrashort laser probe pulse. The integrated system is demonstrated for representative samples of 20-nm SiC nanoparticles in a polymer host and is found to successfully sample the desired optical characteristics.
Keywords :
III-V semiconductors; high-speed optical techniques; nanocomposites; refractive index measurement; silicon compounds; wide band gap semiconductors; SiC; absorption coefficients; nanocomposite material systems; polymer host; probing phase delay; refractive index variance; size 20 nm; spatial coherence effects; ultrafast refractometry; Optical attenuators; Optical interferometry; Optical pulses; Optical refraction; Optical variables control; Refractive index; Ultrafast optics; Autocorrelation; optical interferometry; refractive index; ultrafast photonics;
Journal_Title :
Photonics Technology Letters, IEEE
DOI :
10.1109/LPT.2012.2184089
