Ultrafast Refractometry for Characterization of Nanocomposite Material Systems

Author

Collier, Christopher M. ; Jin, Xian ; Holzman, Jonathan F.

Author_Institution

Univ. of British Columbia, Kelowna, BC, Canada

Volume

24

Issue

7

fYear

2012

fDate

4/1/2012 12:00:00 AM

Firstpage

590

Lastpage

592

Abstract

An ultrafast refractometry technique is introduced for direct characterization of refractive indices, absorption coefficients, and refractive index variances in nanocomposite (NC) assemblies. The system samples bulk NC optical characteristics by probing phase delay, absorption, and spatial coherence effects on an ultrashort laser probe pulse. The integrated system is demonstrated for representative samples of 20-nm SiC nanoparticles in a polymer host and is found to successfully sample the desired optical characteristics.

Keywords

III-V semiconductors; high-speed optical techniques; nanocomposites; refractive index measurement; silicon compounds; wide band gap semiconductors; SiC; absorption coefficients; nanocomposite material systems; polymer host; probing phase delay; refractive index variance; size 20 nm; spatial coherence effects; ultrafast refractometry; Optical attenuators; Optical interferometry; Optical pulses; Optical refraction; Optical variables control; Refractive index; Ultrafast optics; Autocorrelation; optical interferometry; refractive index; ultrafast photonics;

fLanguage

English

Journal_Title

Photonics Technology Letters, IEEE

Publisher

ieee

ISSN

1041-1135

Type

jour

DOI

10.1109/LPT.2012.2184089

Filename

6129476