Title :
Special session 4B: Panel: Testing and calibration for power management circuits
Author :
Ozev, Sule ; Bakkaloglu, Bertan ; Ozev, Sule
Author_Institution :
Arizona State University
Abstract :
Power management units are essential parts in almost every electronic system. PMUs have distinct test and calibration schemes compared to other regular analog circuits since they operate in the large signal mode and the operation heavily depends on the nature of the load. Built-in test and calibration for PMUs is becoming increasingly more common-place due to the challenges posed by increasing process variations, decreasing form factor, and increasingly diverse load conditions. This panel will discuss the challenges related to testing of power management circuits, calibration and built-in test approaches that are currently in place and the way to move forward.
Keywords :
Abstracts; Analog circuits; Calibration; Educational institutions; Phasor measurement units; Testing; Very large scale integration;
Conference_Titel :
VLSI Test Symposium (VTS), 2014 IEEE 32nd
Conference_Location :
Napa, CA, USA
DOI :
10.1109/VTS.2014.6818758