• DocumentCode
    142035
  • Title

    Special session 4B: Panel: Testing and calibration for power management circuits

  • Author

    Ozev, Sule ; Bakkaloglu, Bertan ; Ozev, Sule

  • Author_Institution
    Arizona State University
  • fYear
    2014
  • fDate
    13-17 April 2014
  • Firstpage
    1
  • Lastpage
    1
  • Abstract
    Power management units are essential parts in almost every electronic system. PMUs have distinct test and calibration schemes compared to other regular analog circuits since they operate in the large signal mode and the operation heavily depends on the nature of the load. Built-in test and calibration for PMUs is becoming increasingly more common-place due to the challenges posed by increasing process variations, decreasing form factor, and increasingly diverse load conditions. This panel will discuss the challenges related to testing of power management circuits, calibration and built-in test approaches that are currently in place and the way to move forward.
  • Keywords
    Abstracts; Analog circuits; Calibration; Educational institutions; Phasor measurement units; Testing; Very large scale integration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Test Symposium (VTS), 2014 IEEE 32nd
  • Conference_Location
    Napa, CA, USA
  • Type

    conf

  • DOI
    10.1109/VTS.2014.6818758
  • Filename
    6818758