DocumentCode :
1420450
Title :
Improved Electrical and Thermal Stability of Solution-Processed Li-Doped ZnO Thin-Film Transistors
Author :
Su, Bo-Yuan ; Chu, Sheng-Yuan ; Juang, Yung-Der
Author_Institution :
Dept. of Electr. Eng., Nat. Cheng Kung Univ., Tainan, Taiwan
Volume :
59
Issue :
3
fYear :
2012
fDate :
3/1/2012 12:00:00 AM
Firstpage :
700
Lastpage :
704
Abstract :
The effects of lithium (Li) doping on the performance of solution-processed zinc oxide (ZnO) thin-film transistors (TFTs) grown using the sol-gel method are investigated. Li-doped ZnO films as channel layers are chemically prepared by spin coating the gel with an aqueous solution of zinc acetate dihydrate, Li nitrate, and ethanolamine. TFT devices fabricated with 2 at.% Li-doped films show a good field-effect mobility of 3.31 cm2/V·s, a subthreshold slope of 0.82 V/dec, and an on-off current ratio of over 105. These TFT devices also show good thermal and electrical stability, which is mainly attributed to the compact surface morphology of the channel layer, small carrier concentration, and less oxygen deficiency, which reduces the interface electrical trapping at the gate insulator.
Keywords :
electron traps; lithium; stability; thin film transistors; zinc compounds; ZnO:Li; electrical stability; gate insulator; interface electrical trapping; sol gel method; solution processed thin film transistors; thermal stability; Doping; Logic gates; Temperature measurement; Thermal stability; Thin film transistors; Zinc oxide; Thermal stability; zinc oxide (ZnO) thin-film transistors (TFTs);
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/TED.2011.2179549
Filename :
6129494
Link To Document :
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