Title :
TM/TE modal solutions for submicron lossy metal-clad optical fibres
Author :
Themistos, C. ; Rahman, B.M.A. ; Grattan, K.T.V.
Author_Institution :
Dept. of Electr. Electron. & Inf. Eng., City Univ., London, UK
fDate :
6/1/1998 12:00:00 AM
Abstract :
A finite-element approach with the aid of the perturbation technique is used to determine the complex propagation characteristics of lossy metal-clad optical fibres. The fundamental optical modal field profiles of these structures for the pure TE and TM polarisation are investigated. Metal-clad optical fibres of submicron dimensions find an important application in near-field optical scanning microscopy, a technique rapidly developing in recent years, providing high-resolution imaging in the semiconductor industry and in applications in the biological sciences
Keywords :
finite element analysis; metallic thin films; optical fibre cladding; optical fibre losses; optical fibre polarisation; optical fibre theory; optical microscopy; perturbation theory; TE polarisation; TM polarisation; TM/TE modal solutions; biological sciences; complex propagation characteristics; finite-element approach; fundamental optical modal field profiles; high-resolution imaging; lossy metal-clad optical fibres; near-field optical scanning microscopy; perturbation technique; semiconductor industry; submicron dimensions; submicron lossy metal-clad optical fibres;
Journal_Title :
Optoelectronics, IEE Proceedings -
DOI :
10.1049/ip-opt:19982082