DocumentCode
142065
Title
Unstructured text: Test analysis techniques applied to non-test problems
Author
Gattiker, Anne
Author_Institution
IBM Res. Austin, Austin, TX, USA
fYear
2014
fDate
13-17 April 2014
Firstpage
1
Lastpage
4
Abstract
One of the most apparent trends in test research and application in recent years has been the increasing application of statistical methods and machine learning. The trend has been driven by factors such as increases in data volume, need to detect subtle defects and need to extend beyond test´s traditional sort function to a feedback-providing, yield-learning role. These factors, in turn, reflect needs for efficient data handling, ability to extract small signals from noise, and practically-useful model-building. Similar needs exist in other fields of emerging interest including unstructured text analysis, which in turn supports myriad applications. This paper surveys analysis techniques that have been used in the test domain, draws parallels in unstructured text analysis and suggests insights similar to those used to meet recent test challenges can find application in diverse and emerging fields as well.
Keywords
electronic engineering computing; integrated circuit testing; integrated circuit yield; learning (artificial intelligence); statistical analysis; text analysis; data handling; feedback providing role; machine learning; nontest problems; small signal extraction; statistical methods; test analysis technique; unstructured text; yield learning role; Support vector machine classification; Testing; Text analysis; Transmission line matrix methods; Vectors; Very large scale integration;
fLanguage
English
Publisher
ieee
Conference_Titel
VLSI Test Symposium (VTS), 2014 IEEE 32nd
Conference_Location
Napa, CA
Type
conf
DOI
10.1109/VTS.2014.6818773
Filename
6818773
Link To Document