Title :
Advanced memory topics
Author :
Kirihata, Toshiaki ; Somasekhar, Dinesh
Abstract :
This session covers wide-IO SRAM, high-performance SRAM, LPDDR DRAM, BTI, ECC, and PCM in advanced nano-scale technology.
Keywords :
CMOS integrated circuits; Error correction codes; Logic gates; Next generation networking; Phase change materials; Random access memory; Threshold voltage;
Conference_Titel :
Custom Integrated Circuits Conference (CICC), 2014 IEEE Proceedings of the
Conference_Location :
San Jose, CA, USA
DOI :
10.1109/CICC.2014.6946120
