Title :
Special session 8B — Panel: In-field testing of SoC devices: Which solutions by which players?
Author :
Abraham, J.A. ; Xinli Gu ; MacLaurin, Teresa ; Rajski, J. ; Ryan, Paul G. ; Gizopoulos, D. ; Reorda, M. Sonza
Author_Institution :
Univ. of Texas at Austin, Austin, TX, USA
Abstract :
In-field testing of SoC devices is increasingly important to face the dependability requirements of several application domains. Different solutions can be devised and adopted. We summarize the main solutions currently adopted by industry, identify the most critical open issues, and discuss important future trends.
Keywords :
design for testability; integrated circuit testing; system-on-chip; SoC devices; application domains; dependability requirements; future trends; in-field testing; open issues; Built-in self-test; Companies; Hardware; Manufacturing; Microprocessors; System-on-chip; DfT; EDA; SoC; functional testing; in-field testing;
Conference_Titel :
VLSI Test Symposium (VTS), 2014 IEEE 32nd
Conference_Location :
Napa, CA
DOI :
10.1109/VTS.2014.6818780
