• DocumentCode
    142079
  • Title

    Special session 8B — Panel: In-field testing of SoC devices: Which solutions by which players?

  • Author

    Abraham, J.A. ; Xinli Gu ; MacLaurin, Teresa ; Rajski, J. ; Ryan, Paul G. ; Gizopoulos, D. ; Reorda, M. Sonza

  • Author_Institution
    Univ. of Texas at Austin, Austin, TX, USA
  • fYear
    2014
  • fDate
    13-17 April 2014
  • Firstpage
    1
  • Lastpage
    2
  • Abstract
    In-field testing of SoC devices is increasingly important to face the dependability requirements of several application domains. Different solutions can be devised and adopted. We summarize the main solutions currently adopted by industry, identify the most critical open issues, and discuss important future trends.
  • Keywords
    design for testability; integrated circuit testing; system-on-chip; SoC devices; application domains; dependability requirements; future trends; in-field testing; open issues; Built-in self-test; Companies; Hardware; Manufacturing; Microprocessors; System-on-chip; DfT; EDA; SoC; functional testing; in-field testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Test Symposium (VTS), 2014 IEEE 32nd
  • Conference_Location
    Napa, CA
  • Type

    conf

  • DOI
    10.1109/VTS.2014.6818780
  • Filename
    6818780
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=142079